Vacuum ultraviolet ellipsometry investigation of ultrathin organic films and their heterostructures

J. Sindu, S. Rudra, D. Lehmann, M. Friedrich, D.R.T. Zahn
  • Applied Surface Science, November 2008, Elsevier
  • DOI: 10.1016/j.apsusc.2008.07.055
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http://dx.doi.org/10.1016/j.apsusc.2008.07.055

The following have contributed to this page: Professor Dietrich RT Zahn