Charge transient spectroscopy measurements of GaAs metal–insulator–semiconductor structures

S. Kochowski, M. Szydłowski, I. Thurzo, D.R.T. Zahn
  • Applied Surface Science, August 2006, Elsevier
  • DOI: 10.1016/j.apsusc.2006.03.062

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The following have contributed to this page: Professor Dietrich RT Zahn