Trace element determination using static high-sensitivity inductively coupled plasma optical emission spectrometry (SHIP-OES)

Carsten Engelhard, Andy Scheffer, Sascha Nowak, Torsten Vielhaber, Wolfgang Buscher
  • Analytica Chimica Acta, February 2007, Elsevier
  • DOI: 10.1016/j.aca.2006.10.014

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1016/j.aca.2006.10.014

The following have contributed to this page: Professor Carsten Engelhard