Trace element determination using static high-sensitivity inductively coupled plasma optical emission spectrometry (SHIP-OES)

  • Carsten Engelhard, Andy Scheffer, Sascha Nowak, Torsten Vielhaber, Wolfgang Buscher
  • Analytica Chimica Acta, February 2007, Elsevier
  • DOI: 10.1016/j.aca.2006.10.014

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