Raman and IR spectroscopies: a useful combination to study semiconductor interfaces

D.R.T. Zahn, W. Richter, T. Eickhoff, T.D. Golding
  • Materials Science and Engineering B, January 1990, Elsevier
  • DOI: 10.1016/0921-5107(90)90063-h

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http://dx.doi.org/10.1016/0921-5107(90)90063-h

The following have contributed to this page: Professor Dietrich RT Zahn