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http://dx.doi.org/10.1016/0921-5107(90)90063-h
The following have contributed to this page: Professor Dietrich RT Zahn
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Raman and IR spectroscopies: a useful combination to study semiconductor interfaces
D.R.T. Zahn, W. Richter, T. Eickhoff, T.D. Golding- Materials Science and Engineering B, January 1990, Elsevier
- DOI: 10.1016/0921-5107(90)90063-h
