Erratum to “what determines the probing depth of electron yield XAS?” [surface science 324 (1995) L371]

S.L.M. Schroeder, G.D. Moggridge, R.M. Ormerod, T. Rayment, R.M. Lambert
  • Surface Science, May 1995, Elsevier
  • DOI: 10.1016/0039-6028(95)00394-0

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http://dx.doi.org/10.1016/0039-6028(95)00394-0

The following have contributed to this page: Professor Sven L M Schroeder