In situ optical characterisation with monolayer sensitivity: the As-terminated Si(111) surface

U. Rossow, U. Frotscher, W. Richter, D.R.T. Zahn
  • Surface Science, May 1993, Elsevier
  • DOI: 10.1016/0039-6028(93)91060-3

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http://dx.doi.org/10.1016/0039-6028(93)91060-3

The following have contributed to this page: Professor Dietrich RT Zahn