4517154 Self-test subsystem for nuclear reactor protection system

  • UlricE Dennis, Dennis Hollenbeck, John Kirtland, KennethB Stackhouse, PatriciaA Wilson, WilliamD Hill, DavidD Akers, ElmerD Hill
  • Microelectronics Reliability, January 1986, Elsevier
  • DOI: 10.1016/0026-2714(86)90755-9

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http://dx.doi.org/10.1016/0026-2714(86)90755-9