Effects of SiO2 interlayer on electrical properties of Al-doped ZnO films under bending stress

Young Soo Lim, Seul Gi Seo, Bo Bae Kim, Hyoung-Seuk Choi, Won-Seon Seo, Yong Soo Cho, Hyung-Ho Park
  • Electronic Materials Letters, August 2012, Springer Science + Business Media
  • DOI: 10.1007/s13391-012-2006-1

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http://dx.doi.org/10.1007/s13391-012-2006-1

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