Novel Approach to Improve Electronics Reliability in the Next Generation of US Army Small Unmanned Ground Vehicles Under Complex Vibration Conditions

Ed Habtour, Cholmin Choi, Michael Osterman, Abhijit Dasgupta
  • Journal of Failure Analysis and Prevention, January 2012, Springer Science + Business Media
  • DOI: 10.1007/s11668-011-9533-1

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http://dx.doi.org/10.1007/s11668-011-9533-1

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