This shareable PDF can be hosted on any platform or network and is fully compliant with publisher copyright.
Defect-recognition, Imaging and Physics in Semiconductors conference proceedings
This page is a summary of: Foreword, Journal of Electronic Materials, April 2010, Springer Science + Business Media,
DOI: 10.1007/s11664-010-1223-3.
You can read the full text:
The following have contributed to this page
Journal of Computational and Applied Mathematics
The principal objective of this paper is to introduce an efficient numerical method based on LWs and Legendre– Gauss quadrature rule to estimate the approximate solution of fractional Fredholm–Volt...
IET Renewable Power Generation
This paper presents an organized and concise review of MPPT techniques implemented for the PV systems in the literature along with recent publications on various hardware design methodologies.
IET Science Measurement & Technology
Position signal faces several weak oscillations due to mechanical flaw and faults occurred in the systems. These oscillations can be identified by the encoders that determine the performance and he...
