Mapping Residual Stress Distributions at the Micron Scale in Amorphous Materials

Bartlomiej Winiarski, Richard M. Langford, Jiawan Tian, Yoshihiko Yokoyama, Peter K. Liaw, Philip J. Withers
  • Metallurgical and Materials Transactions A, December 2009, Springer Science + Business Media
  • DOI: 10.1007/s11661-009-0127-4

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http://dx.doi.org/10.1007/s11661-009-0127-4

The following have contributed to this page: Professor Philip J Withers