Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations

Andrea Lucibello, Romolo Marcelli, Emanuela Proietti, Giancarlo Bartolucci, Viviana Mulloni, Benno Margesin
  • Microsystem Technologies, March 2014, Springer Science + Business Media
  • DOI: 10.1007/s00542-014-2124-9

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The following have contributed to this page: Viviana Mulloni and Dr Romolo Marcelli