Reliability of RF MEMS switches due to charging effects and their circuital modelling

Romolo Marcelli, Giancarlo Bartolucci, George Papaioannu, Giorgio De Angelis, Andrea Lucibello, Emanuela Proietti, Benno Margesin, Flavio Giacomozzi, François Deborgies
  • Microsystem Technologies, January 2010, Springer Science + Business Media
  • DOI: 10.1007/s00542-009-1006-z

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http://dx.doi.org/10.1007/s00542-009-1006-z

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