Electron microscopy and electron diffraction study of ordering in Ni4W

G. Van Tendeloo, N. S. Mishra, C. Suryanarayana
  • Journal of Materials Science, June 1976, Springer Science + Business Media
  • DOI: 10.1007/bf02396657

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http://dx.doi.org/10.1007/bf02396657

The following have contributed to this page: Professor C Suryanarayana