Potential Path of DNA Damage: Electron Attachment–Induced DNA Single-Strand Breaks

Jiande Gu, Jing Wang, Jerzy Leszczynski
  • January 2012, Springer Science + Business Media
  • DOI: 10.1007/978-94-007-0923-2_14

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http://dx.doi.org/10.1007/978-94-007-0923-2_14

The following have contributed to this page: Professor Jerzy Leszczynski