Publication not explained

This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.

If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.

Featured Image

Read the Original

This page is a summary of: Temperature dependence of the point defect properties of GaN thin films studied by terahertz time-domain spectroscopy, Science China Physics Mechanics and Astronomy, September 2013, Springer Science + Business Media, DOI: 10.1007/s11433-013-5202-6.
You can read the full text:



The following have contributed to this page