A Shift-Register Based BIST Architecture for FPGA Global Interconnect Testing and Diagnosis

  • Igor Gadelha Pereira, Leonardo Alves Dias, Cleonilson Protásio de Souza
  • Journal of Electronic Testing, March 2015, Springer Science + Business Media
  • DOI: 10.1007/s10836-015-5515-7

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http://dx.doi.org/10.1007/s10836-015-5515-7