X-tolerant Test Data Compaction with Accelerated Shift Registers

  • Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel
  • Journal of Electronic Testing, June 2009, Springer Science + Business Media
  • DOI: 10.1007/s10836-009-5107-5

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http://dx.doi.org/10.1007/s10836-009-5107-5