Spectroscopic ellipsometric characterization of organic films obtained via organic vapor phase deposition

C. Himcinschi, N. Meyer, S. Hartmann, M. Gersdorff, M. Friedrich, H.-H. Johannes, W. Kowalsky, M. Schwambera, G. Strauch, M. Heuken, D.R.T. Zahn
  • Applied Physics A, February 2005, Springer Science + Business Media
  • DOI: 10.1007/s00339-004-2973-7
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