Optical spectroscopy for in situ characterisation of semiconductor interfaces and layers

Dietrich R. T. Zahn
  • Analytical and Bioanalytical Chemistry, May 1997, Springer Science + Business Media
  • DOI: 10.1007/s002160050336

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http://dx.doi.org/10.1007/s002160050336

The following have contributed to this page: Professor Dietrich RT Zahn