Amplitude, Phase Contrast, and Polarization Imaging in Near-Field Scanning Optical Microscopy

  • M. Vaez-Iravani, R. Toledo-Crow
  • January 1993, Springer Science + Business Media
  • DOI: 10.1007/978-94-011-1978-8_4

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http://dx.doi.org/10.1007/978-94-011-1978-8_4