Failure analysis

Titu I. Băjenescu, Marius I. Bâzu
  • January 1999, Springer Science + Business Media
  • DOI: 10.1007/978-3-642-58505-0_14

What is it about?

This is a chapter of the book dedicated to the reliability of electronic components.

The following have contributed to this page: Prof. Titu I. Bajenescu and Marius Bazu