Design-for-Test in a Multiple Substrate Multichip Module

  • Joel A. Jorgenson, Russell J. Wagner, Y. Zorian
  • January 1997, Springer Science + Business Media
  • DOI: 10.1007/978-1-4615-6107-1_9

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http://dx.doi.org/10.1007/978-1-4615-6107-1_9