XPS and ToF-SIMS study of a chalcopyrite-pyrite-sphalerite mixture treated with xanthate and sodium bisulphite

T. N. Khmeleva, T. V. Georgiev, M. Jasieniak, W. M. Skinner, D. A. Beattie
  • Surface and Interface Analysis, January 2005, Wiley
  • DOI: 10.1002/sia.2067

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http://dx.doi.org/10.1002/sia.2067

The following have contributed to this page: Associate Professor David Allan Beattie