CdTe and anodic oxides on Hg1−xCdxTe: interface and compositional analysis using Rutherford backscattering spectroscopy

Anjali, P. Srivastava, S. Mohapatra, R. Pal, H. P. Vyas, B. R. Sekhar, H. K. Sehgal
  • Surface and Interface Analysis, January 2005, Wiley
  • DOI: 10.1002/sia.2050

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http://dx.doi.org/10.1002/sia.2050

The following have contributed to this page: Dr. Satyabrata Mohapatra