Planning of Truncated Sequential Binomial Test via Relative Efficiency

Yefim Haim Michlin, Ofer Shaham
  • Quality and Reliability Engineering International, February 2012, Wiley
  • DOI: 10.1002/qre.1387

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Yefim Michlin