Complex dielectric function of ion implantation amorphized SiC determined by spectroscopic ellipsometry

T. Lohner, Z. Zolnai, P. Petrik, G. Battistig, J. Garcia López, Y. Morilla, A. Koós, Z. Osváth, M. Fried
  • physica status solidi (c), May 2008, Wiley
  • DOI: 10.1002/pssc.200777883

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http://dx.doi.org/10.1002/pssc.200777883

The following have contributed to this page: Dr. Zoltán Osváth