What is it about?

Although the device performance has been achieved enough for using commercial products, the behavior of the carriers in practical OLED devices during operation is still controversial. Especially, the interfacial structures and properties of the OLEDs are extremely important in determining their charge carrier transport properties across the interfaces, since both the charge transport and the charge densities in organic layers are directly associated with the performance and reliability of the OLEDs. We herein report the direct observation of the intrinsic degradation behavior by long-term operation of the OLEDs, charge injection, transport, and accumulation behavior in OLED devices by electric-field-induced doubly resonant sum-frequency generation (EFI-DR-SFG) spectroscopy.

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Why is it important?

This study describes the application of EFI-DR-SFG spectroscopy to study the charge carrier behavior of high-efficient blue OLEDs under operation. The use of this new technique allows us to observe the carrier behavior at the buried organic interfaces of OLEDs varied with time in response to the applied bias voltage non-destructively.


The series of experimental EFI-DR-SFG measurements demonstrate that this technique is an effective operando analytical tool for investigating the carrier behavior of the buried interfaces in multilayer organic devices even with complicated operating mechanisms.

Takayuki Miyamae
Chiba Daigaku

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This page is a summary of: Operando sum‐frequency generation spectroscopy of high‐efficiency OLEDs for probing the charge carrier behavior, Journal of the Society for Information Display, August 2021, Wiley,
DOI: 10.1002/jsid.1076.
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