Defect-induced fundamental edge distoritons in two-photon spectroscopy of semiconductors

V. I. Gavryushin, A. Kazlauskas, G. Račiukaitis
  • Advanced Materials for Optics and Electronics, January 1994, Wiley
  • DOI: 10.1002/amo.860030135

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Dr Gediminas Raciukaitis