Defect-induced fundamental edge distoritons in two-photon spectroscopy of semiconductors

V. I. Gavryushin, A. Kazlauskas, G. Račiukaitis
  • Advanced Materials for Optics and Electronics, January 1994, Wiley
  • DOI: 10.1002/amo.860030135

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http://dx.doi.org/10.1002/amo.860030135

The following have contributed to this page: Dr Gediminas Raciukaitis