X-ray-induced degradation of OEG-terminated SAMs on silica surfaces during XPS characterization

  • X-ray-induced degradation of OEG-terminated SAMs
  • Francisco Palazon, Thomas Géhin, Djawhar Ferrah, Anaïs Garnier, Claude Botella, Geneviève Grenet, Éliane Souteyrand, Jean-Pierre Cloarec, Yann Chevolot
  • Surface and Interface Analysis, April 2015, Wiley
  • DOI: 10.1002/sia.5768

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http://dx.doi.org/10.1002/sia.5768

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