Charge transient spectroscopy measurements of metal-oxide-semiconductor

Markus Arnold, Axel Fechner, Dietrich R. T. Zahn
  • physica status solidi (c), February 2010, Wiley
  • DOI: 10.1002/pssc.200982483
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http://dx.doi.org/10.1002/pssc.200982483

The following have contributed to this page: Professor Dietrich RT Zahn