New method for the determination of the defect profile in thin layers grown over a substrate

A. Zubiaga, J. A. García, F. Plazaola, F. Tuomisto, J. Zúñiga, V. Muñoz-Sanjosé
  • physica status solidi (c), September 2007, Wiley
  • DOI: 10.1002/pssc.200675733
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http://dx.doi.org/10.1002/pssc.200675733

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