DLTS characterization of proton-implanted silicon under varying annealing conditions

J. G. Laven, M. Jelinek, R. Job, W. Schustereder, H.-J. Schulze, M. Rommel, L. Frey
  • physica status solidi (b), September 2014, Wiley
  • DOI: 10.1002/pssb.201400028
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The following have contributed to this page: Dr. Mathias Rommel