Ellipsometry from infrared to vacuum ultraviolet: Structural properties of thin anisotropic guanine films on silicon

K. Hinrichs, S. D. Silaghi, C. Cobet, N. Esser, D. R. T. Zahn
  • physica status solidi (b), November 2005, Wiley
  • DOI: 10.1002/pssb.200541154
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http://dx.doi.org/10.1002/pssb.200541154

The following have contributed to this page: Professor Dietrich RT Zahn