MicroRaman studies of implantation-induced amorphization of Si and subsequent regrowth under high-pressure and high-temperature treatment

Yu. M. Azhniuk, P. Schäfer, A. V. Gomonnai, A. Misiuk, M. Prujszczyk, D. R. T. Zahn
  • physica status solidi (a), November 2010, Wiley
  • DOI: 10.1002/pssa.201026248

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http://dx.doi.org/10.1002/pssa.201026248

The following have contributed to this page: Professor Dietrich RT Zahn