Nondestructive testing for metallic flaws using inductive coil sensor with circular typed single loop excitation coil

Ki Hyeon Kim, Jun Sik Lee, Nanyong Kim, Doguen Jang, Young Ho Kim, Jongryoul Kim
  • physica status solidi (a), December 2007, Wiley
  • DOI: 10.1002/pssa.200777288

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