What is it about?
We addressed industrially lapped and polished quartz crystal wafers as the materials - which of course have to be as flat and smooth as possible in view of applications - with SEM images. The coupons were different crystal orientations (Y-, AT-, and Z-cut) treated with different normal stress and abrasive grit size. The SEM images - even though not intrinsically 3D - were analyzed by advanced tools, namely stereometric and fractal/multifractal approach.
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Why is it important?
It deals with the longstanding goal of material scientists of being able to associate simple analysis of the surface morphology of their materials with performance quality score.
Read the Original
This page is a summary of: Morphologic characterization and fractal analysis of lapped and polished surfaces of quartz single crystals, Microscopy Research and Technique, September 2021, Wiley, DOI: 10.1002/jemt.23943.
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