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  1. Three-Dimensional Imaging of Extended Defects in 4H-SiC

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    Dr. Ryohei Tanuma

  2. Three-Dimensional Imaging of Extended Defects in 4H-SiC by Two-Photon-Excited Band-Edge Photoluminescence

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    Dr. Ryohei Tanuma

  3. Three-dimensional imaging and tilt-angle analysis of dislocations in 4H-SiC by two-photon-excited band-edge photoluminescence

    Article • Applied Physics Express, December 2014, Japan Society of Applied Physics

    Dr. Ryohei Tanuma