All Stories

  1. SUBHDIP: process variations tolerant subthreshold Darlington pair-based NBTI sensor circuit

    Article • IET Computers & Digital Techniques, May 2019, the Institution of Engineering and Technology (the IET)

    Mr. Ankur Beohar

  2. Symmetric dual Gate Insulator based FinFET Module and Design Window for Reliable Circuits

    Article • Micro & Nano Letters, November 2018, the Institution of Engineering and Technology (the IET)

    Mr. Ankur Beohar

  3. NMOS Only Schmitt Trigger Circuit for NBTI Resilient CMOS Circuits

    Article • Electronics Letters, May 2018, the Institution of Engineering and Technology (the IET)

    Mr. Ankur Beohar

  4. Analysis of trap assisted tunneling in asymmetrical underlap 3D-cylindrical GAA-TFET based on hetero-spacer engineering for improved device reliability

    Article • Micro & Nano Letters, July 2017, the Institution of Engineering and Technology (the IET)

    Mr. Ankur Beohar

  5. Low power device investigation

    Article • Micro & Nano Letters, August 2016, the Institution of Engineering and Technology (the IET)

    Mr. Ankur Beohar