All Stories

  1. Study of the nanoscale electric discharge induced FLG peeling off during the STM electric lithography

    Article • Micro & Nano Letters, June 2017, the Institution of Engineering and Technology (the IET)

    Dr Ye YANG

  2. Comparison of the bias voltage effect and the force effect during the nanoscale AFM electric lithography on the copper thin film surface

    Article • Scanning, November 2015, Wiley

    Dr Ye YANG