All Stories

  1. Reliability analysis for electronic devices using beta-Weibull distribution

    Article • Quality and Reliability Engineering International, September 2017, Wiley

    Luis Alberto Rodríguez-Picón, Dr Luis Carlos Mendez

  2. Bivariate degradation modelling with marginal heterogeneous stochastic processes

    Article • Journal of Statistical Computation and Simulation, May 2017, Taylor & Francis

    Luis Alberto Rodríguez-Picón, Dr Luis Carlos Mendez

  3. Degradation modeling based on gamma process models with random effects

    Article • Communications in Statistics - Simulation and Computation, May 2017, Taylor & Francis

    Luis Alberto Rodríguez-Picón, Dr Luis Carlos Mendez

  4. Reliability Analysis for Laptop Computer Under Electrical Harmonics

    Article • Quality and Reliability Engineering International, March 2016, Wiley

    Dr Luis Carlos Mendez

  5. Reliability Model for Electronic Devices under Time Varying Voltage

    Article • Quality and Reliability Engineering International, October 2015, Wiley

    Dr Luis Carlos Mendez, Luis Alberto Rodríguez-Picón