All Stories

  1. Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!

    Article • Microscopy and Microanalysis, August 2016, Cambridge University Press

    Dr Dale E. Newbury

  2. Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II

    Article • Microscopy and Microanalysis, September 2015, Cambridge University Press

    Dr Dale E. Newbury