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  1. Effects of low-temperature thermal annealing on interface characteristics in IZO/IGZO dual-channel thin-film transistors
  2. Different degradation mechanism by conduction region in AsTeGeSiN threshold switching device
  3. Drowsy driving detection using neural network with backpropagation algorithm implemented by FPGA
  4. Remained p-GaN effect to turn-off energy loss (E off) in p-GaN gate power devices