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  1. Statistical Evaluation of Corner Detectors: Does the Statistical Test Have An Effect?

    Article • IET Computer Vision, May 2018, the Institution of Engineering and Technology (the IET)

    Dr Erkan Bostanci

  2. Is Hamming distance only way for matching binary image feature descriptors?

    Article • Electronics Letters, May 2014, the Institution of Engineering and Technology (the IET)

    Dr Erkan Bostanci