All Stories

  1. Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging

    Article • Journal of Synchrotron Radiation, June 2015, International Union of Crystallography

    Dr Zhi Juan Li

  2. Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

    Article • Journal of Crystal Growth, March 2011, Elsevier

    Dr Zhi Juan Li

  3. Dislocation sources and slip band nucleation from indents on silicon wafers

    Article • Journal of Applied Crystallography, August 2010, International Union of Crystallography

    Dr Zhi Juan Li

  4. X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers

    Article • Powder Diffraction, June 2010, Cambridge University Press

    Dr Zhi Juan Li

  5. Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography

    Article • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, February 2010, Elsevier

    Dr Zhi Juan Li