All Stories

  1. Subsampled STEM-ptychography
  2. Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM
  3. Ideal versus real: simulated annealing of experimentally derived and geometric platinum nanoparticles
  4. Managing dose-, damage- and data-rates in multi-frame spectrum-imaging
  5. Electron ptychographic phase imaging using fast pixelated detectors
  6. Imaging charge transfer in crystals using electron ptychography
  7. Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM-XX)
  8. Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution
  9. Electrochemical CO Oxidation at Platinum on Carbon Studied through Analysis of Anomalous in Situ IR Spectra
  10. Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping
  11. Route to achieving perfect B-site ordering in double perovskite thin films
  12. Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset
  13. From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology
  14. Mapping the Chemistry Within, and the Strain Around, Al-alloy Precipitates at Atomic Resolution by Multi-frame Scanning Transmission Electron Microscopy
  15. Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision
  16. Quantitative STEM of Catalyst Nanoparticles using ADF Imaging with Simultaneous EDS and EELS Spectroscopy.
  17. Predicting the Oxygen-Binding Properties of Platinum Nanoparticle Ensembles by Combining High-Precision Electron Microscopy and Density Functional Theory
  18. Hybrid statistics-simulations based method for atom-counting from ADF STEM images
  19. Simultaneous imaging of light and heavy elements at atomic resolution using electron ptychography and fast pixelated detectors
  20. Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy
  21. 3D elemental mapping with nanometer scale depth resolution via electron optical sectioning
  22. Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities
  23. Atomic resolution electron microscopy of cobalt ferrite nanoparticles
  24. Efficient and quantitative phase imaging in two- and three-dimensions using electron ptychography in STEM
  25. Experiment design for quantitative dark field imaging and spectroscopy of catalyst nanoparticles using Scanning Transmission Electron Microscopy (STEM)
  26. Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
  27. Monochromated STEM-EELS Analysis of Interface-Induced Polarization in LaCrO3-SrTiO3 Superlattices
  28. Nano-scale strain measurements from high-precision ADF STEM
  29. New Opportunities in multi-frame STEM Spectroscopy & Fractional Beam-current EELS
  30. Non-destructive nanoparticle characterisation using a minimum electron dose in quantitative ADF STEM: how low can one go?
  31. Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector
  32. STEM optical sectioning for imaging screw dislocation core structures
  33. Study on the robustness of electron ptychography for phase imaging in the STEM using fast pixelated detectors
  34. Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges
  35. Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
  36. ADF-STEM Imaging of Nascent Phases and Extended Disorder Within the Mo–V–Nb–Te–O Catalyst System
  37. Correlative Aberration-Corrected STEM-HAADF and STEM-EELS Analysis of Interface-Induced Polarization in LaCrO 3 -SrTiO 3 Superlattices
  38. STEM Optical Sectioning for Imaging Screw Dislocations Core Structures in BCC Metals
  39. Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM
  40. Maghemite-like regions at the crossing of two antiphase boundaries in doped BiFeO3
  41. Interface-Induced Polarization in SrTiO3-LaCrO3Superlattices
  42. Quantitative ADF STEM: acquisition, analysis and interpretation
  43. Quantitative STEM normalisation: The importance of the electron flux
  44. 4D STEM: High efficiency phase contrast imaging using a fast pixelated detector
  45. Quantification of a Heterogeneous Ruthenium Catalyst on Carbon-black using ADF Imaging
  46. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?
  47. Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides
  48. Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors
  49. Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design
  50. High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors
  51. Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging
  52. STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures
  53. Smart Align—a new tool for robust non-rigid registration of scanning microscope data
  54. Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning
  55. Polarization screening-induced magnetic phase gradients at complex oxide interfaces
  56. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
  57. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting
  58. Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy
  59. Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z-Contrast Electron Microscopy
  60. Maximum Efficiency STEM Phase Contrast Imaging
  61. Testing the accuracy of the two-dimensional object model in HAADF STEM
  62. Probing Atomic Scale Dynamics with STEM
  63. Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM
  64. Optical Sectioning with Atomic Resolution Spectroscopy
  65. Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting
  66. Structural quantification of nanoparticles by HAADF STEM
  67. How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification
  68. Two-dimensional Object Functions and Three-dimensional Illumination Functions: their Validity, Interaction and Utility
  69. Scan-noise and Drift Correction in the STEM
  70. Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope
  71. WS2 2D nanosheets in 3D nanoflowers
  72. Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope
  73. Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM)
  74. STEM Image Post-processing for Instability and Aberration Correction for Transfer Function Extension
  75. Focal Series Reconstruction in Annular Dark-Field STEM
  76. Post-processing of STEM Data for Instability and Drift Compensation