All Stories

  1. Compensation of motion coupling effect in AFM imaging

    Article • Micro & Nano Letters, October 2020, the Institution of Engineering and Technology (the IET)

    Dr Md Sohel Rana

  2. Error compensation in atomic force microscope scanned images

    Article • Micro & Nano Letters, January 2016, the Institution of Engineering and Technology (the IET)

    Dr Md Sohel Rana

  3. Nonlinearity Effects Reduction of an AFM Piezoelectric Tube Scanner Using MIMO MPC

    Article • IEEE/ASME Transactions on Mechatronics, June 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  4. Performance of Sinusoidal Scanning With MPC in AFM Imaging

    Article • IEEE/ASME Transactions on Mechatronics, February 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  5. Tracking of Triangular Reference Signals Using LQG Controllers for Lateral Positioning of an AFM Scanner Stage

    Article • IEEE/ASME Transactions on Mechatronics, August 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  6. Effect of Improved Tracking for Atomic Force Microscope on Piezo Nonlinear Behavior

    Article • Asian Journal of Control, July 2014, Wiley

    Dr Md Sohel Rana

  7. The design of model predictive control for an AFM and its impact on piezo nonlinearities

    Article • European Journal of Control, July 2014, Elsevier

    Dr Md Sohel Rana

  8. Approach for improved positioning of an atomic force microscope piezoelectric tube scanner

    Article • Micro & Nano Letters, June 2014, the Institution of Engineering and Technology (the IET)

    Dr Md Sohel Rana

  9. Cross-coupling effect compensation of an AFM piezoelectric tube scanner for improved nanopositioning

    Article • June 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  10. Creep, hysteresis, and vibration effects attenuation in an AFM PTS

    Article • June 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  11. Spiral Scanning With Improved Control for Faster Imaging of AFM

    Article • IEEE Transactions on Nanotechnology, May 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  12. Advanced Control of Atomic Force Microscope for Faster Image Scanning

    Article • December 2013, Springer Science + Business Media

    Dr Md Sohel Rana

  13. Spiral scanning of atomic force microscope for faster imaging

    Article • December 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  14. Creep, Hysteresis, and Cross-Coupling Reduction in the High-Precision Positioning of the Piezoelectric Scanner Stage of an Atomic Force Microscope

    Article • IEEE Transactions on Nanotechnology, November 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  15. Reduction of cross-coupling between X-Y axes of piezoelectric scanner stage of atomic force microscope for faster scanning

    Article • August 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  16. Nonlinearity compensation for improved nanopositioning of atomic force microscope

    Article • August 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  17. Control of resonant modes of a smart structure using OMPC

    Article • June 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  18. Improvement of the tracking accuracy of an AFM using MPC

    Article • June 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  19. LQG controller with sinusoidal reference signal modeling for spiral scanning of atomic force microscope

    Article • June 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  20. High-Speed AFM Image Scanning Using Observer-Based MPC-Notch Control

    Article • IEEE Transactions on Nanotechnology, March 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  21. High performance control of atomic force microscope for high-speed image scanning

    Article • December 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana

  22. Model predictive control of atomic force microscope for fast image scanning

    Article • December 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Md Sohel Rana