All Stories

  1. Modeling and simulation of 2DEG density and intrinsic capacitances in AlInN/GaN MOSHEMT
  2. Effect of thin gate dielectrics on DC, radio frequency and linearity characteristics of lattice-matched AlInN/AlN/GaN metal–oxide–semiconductor high electron mobility transistor
  3. Interface DOS dependent analytical model development for DC characteristics of normally-off AlN/GaN MOSHEMT
  4. Modeling and simulation of oxide dependent 2DEG sheet charge density in AlGaN/GaN MOSHEMT
  5. Impact of oxide thickness on gate capacitance – Modelling and comparative analysis of GaN-based MOSHEMTs
  6. Impact of barrier thickness on gate capacitance—modeling and comparative analysis of GaN based MOSHEMTs
  7. Modeling and comparative analysis of DC characteristics of AlGaN/GaN HEMT and MOSHEMT devices
  8. Comparative study of AlN/GaN HEMT and MOSHEMT structures by varying oxide thickness