All Stories

  1. 3D Auger quantitative depth profiling of individual nanoscaled III–V heterostructures

    Article • Journal of Electron Spectroscopy and Related Phenomena, November 2016, Elsevier

    Dr Wael Hourani

  2. Extended monolayer of cyano-ended oligo(para-phenylenes) at the air/HOPG interface investigated by high-resolution AFM

    Article • Nanotechnology, September 2016, Institute of Physics Publishing

    Dr Wael Hourani

  3. From Solid-State Dewetting of Ultrathin, Compressively Strained Silicon–Germanium-on-Insulator Films to Mastering the Stoichiometry of Si1–xGexNanocrystals

    Article • The Journal of Physical Chemistry C, April 2016, American Chemical Society (ACS)

    Dr Wael Hourani

  4. Chemical depth profiling and 3D reconstruction of III-V heterostructures selectively grown on non-planar Si substrates by MOCVD

    Article • physica status solidi (RRL) - Rapid Research Letters, February 2015, Wiley

    Dr Wael Hourani

  5. Nanoscale elemental quantification in heterostructured SiGe nanowires

    Article • Nanoscale, January 2015, Royal Society of Chemistry

    Dr Wael Hourani

  6. Thermal exfoliation of fluorinated graphite

    Article • Carbon, October 2014, Elsevier

    Dr Wael Hourani

  7. Nanoscale Surface and Sub-Surface Chemical Analysis of SiGe Nanowires

    Article • Microscopy and Microanalysis, August 2014, Cambridge University Press

    Dr Wael Hourani

  8. Anisotropic charge transport in large single crystals of π-conjugated organic molecules

    Article • Nanoscale, January 2014, Royal Society of Chemistry

    Dr Wael Hourani

  9. LaAlO3/Si capacitors: Comparison of different molecular beam deposition conditions and their impact on electrical properties

    Article • Journal of Applied Physics, January 2013, American Institute of Physics

    Dr Wael Hourani

  10. Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope

    Article • Microelectronics Reliability, December 2011, Elsevier

    Dr Wael Hourani

  11. Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si02/Si films: Investigation of the best experimental conditions with a conductive-atomic force microscope

    Article • Journal of Applied Physics, July 2011, American Institute of Physics

    Dr Wael Hourani, Professor Filip Ilie

  12. Study of the physical and electrical degradation of thin oxide films by atomic force microscope

    Article • Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, January 2011, American Vacuum Society

    Dr Wael Hourani

  13. Nanoscale Study of the Influence of Atomic Oxygen on the Electrical Properties of LaAlO3 Thin High-k Oxide Films Deposited by Molecular Beam Epitaxy

    Article • January 2009, Cambridge University Press

    Dr Wael Hourani