All Stories

  1. Materials characterisation and modelling on the small scale

    Article • Materials Science and Technology, September 2018, Taylor & Francis

    Dr Thomas Walther

  2. Stranski–Krastanov growth of (Si)Ge/Si(001): transmission electron microscopy compared with segregation theory

    Article • Materials Science and Technology, April 2018, Taylor & Francis

    Dr Thomas Walther

  3. Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy

    Article • physica status solidi c, January 2015, Wiley

    Dr Thomas Walther

  4. Electron microscopy of quantum dots

    Article • Journal of Microscopy, November 2014, Wiley

    Dr Thomas Walther

  5. What environmental transmission electron microscopy measures and how this links to diffusivity: thermodynamics versus kinetics

    Article • Journal of Microscopy, November 2014, Wiley

    Dr Thomas Walther

  6. Twinning in GaAs nanowires on patterned GaAs(111)B

    Article • Crystal Research and Technology, October 2014, Wiley

    Dr Thomas Walther

  7. Scanning transmission electron microscopy measurement of bismuth segregation in thin Ga(As,Bi) layers grown by molecular beam epitaxy

    Article • Crystal Research and Technology, July 2014, Wiley

    Dr Thomas Walther

  8. The influence of emitter conditioning on the performance of a tungsten <111> cold field emission gun operating at 300 kV

    Article • Journal of Physics Conference Series, June 2014, Institute of Physics Publishing

    Dr Thomas Walther

  9. Similarity of Stranski-Krastanow growth of Ge/Si and SiGe/Si (001)

    Article • Journal of Applied Physics, January 2014, American Institute of Physics

    Dr Thomas Walther

  10. How to best measure atomic segregation to grain boundaries by analytical transmission electron microscopy

    Article • Journal of Materials Science, December 2013, Springer Science + Business Media

    Dr Thomas Walther

  11. Towards the structure of rare earth luminescence centres – terbium doped aluminium nitride as an example system

    Article • Journal of Physics Conference Series, November 2013, Institute of Physics Publishing

    Dr Thomas Walther

  12. Calibration of thickness-dependent k -factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy

    Article • Journal of Physics Conference Series, November 2013, Institute of Physics Publishing

    Dr Thomas Walther

  13. Study of site controlled quantum dot formation on focused ion beam patterned GaAs substrate

    Article • Journal of Physics Conference Series, November 2013, Institute of Physics Publishing

    Dr Thomas Walther

  14. 18th Microscopy of Semiconducting Materials Conference (MSM XVIII)

    Article • Journal of Physics Conference Series, November 2013, Institute of Physics Publishing

    Dr Thomas Walther

  15. Investigation of growth of thin layers of perovskite on native silicon dioxide by a combination of atomic force microscopy and transmission electron microscopy

    Article • Journal of Physics Conference Series, November 2013, Institute of Physics Publishing

    Dr Thomas Walther

  16. GaN-based radial heterostructure nanowires grown by MBE and ALD

    Article • Journal of Physics Conference Series, November 2013, Institute of Physics Publishing

    Dr Thomas Walther

  17. Homogeneous Array of Nanowire-Embedded Quantum Light Emitters

    Article • Nano Letters, March 2013, American Chemical Society (ACS)

    Dr Thomas Walther

  18. Controlled Quantum Dot Formation on Focused Ion Beam-Patterned GaAs Substrates

    Article • January 2013, Springer Science + Business Media

    Dr Thomas Walther

  19. Aberration Corrected High-Resolution Transmission and Scanning Transmission Electron Microscopy of Thin Perovskite Layers

    Article • Physics Procedia, January 2013, Elsevier

    Dr Thomas Walther

  20. The Stranski-Krastanow transition in SiGe epitaxy investigated by scanning transmission electron microscopy

    Article • physica status solidi (a), November 2012, Wiley

    Dr Thomas Walther

  21. Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision

    Article • Journal of Materials Science, September 2012, Springer Science + Business Media

    Dr Thomas Walther

  22. Study of controlled quantum dot formation on focused ion beam patterned GaAs substrates

    Article • August 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Thomas Walther

  23. Characterization of thickness, elemental distribution and band-gap properties in AlGaN/GaN quantum wells by aberration-corrected TEM/STEM

    Article • Journal of Physics Conference Series, July 2012, Institute of Physics Publishing

    Dr Thomas Walther

  24. Self-consistent absorption corrections for low-energy X-ray lines in energy-dispersive X-ray spectroscopy

    Article • Journal of Physics Conference Series, July 2012, Institute of Physics Publishing

    Dr Thomas Walther

  25. Electron Microscopy and Analysis Group Conference 2011 (EMAG 2011)

    Article • Journal of Physics Conference Series, July 2012, Institute of Physics Publishing

    Dr Thomas Walther

  26. Configuring a 300kV cold field-emission gun for optimum analytical performance

    Article • Journal of Physics Conference Series, July 2012, Institute of Physics Publishing

    Dr Thomas Walther

  27. Performance of a cold-field emission gun double aberration corrected TEM/STEM at 80kV

    Article • Journal of Physics Conference Series, July 2012, Institute of Physics Publishing

    Dr Thomas Walther

  28. Measurement of the Al content in AlGaN epitaxial layers by combined energy-dispersive X-ray and electron energy-loss spectroscopy in a transmission electron microscope

    Article • physica status solidi c, February 2012, Wiley

    Dr Thomas Walther

  29. Epitaxial growth of relaxed germanium layers by reduced pressure chemical vapour deposition on (110) and (111) silicon substrates

    Article • Thin Solid Films, February 2012, Elsevier

    Dr Thomas Walther

  30. Characterization of InGaN/GaN epitaxial layers by aberration corrected TEM/STEM

    Article • physica status solidi c, January 2012, Wiley

    Dr Thomas Walther

  31. Nanoscale EELS analysis of elemental distribution and band-gap properties in AlGaN epitaxial layers

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  32. Accurate calibration for the quantification of the Al content in AlGaN epitaxial layers by energy-dispersive X-ray spectroscopy in a Transmission Electron Microscope

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  33. GaAsBi atomic surface order and interfacial roughness observed by STM and TEM

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  34. Comparison of the contrast in conventional and lattice resolved ADF STEM images of InGaAs/GaAs structures using different camera lengths

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  35. Quantification of series of X-ray spectra taken at different tilts in analytical transmission electron microscopy

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  36. 17th International Conference on Microscopy of Semiconducting Materials 2011

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  37. Investigation of boron implantation into silicon by quantitative energy-filtered transmission electron microscopy

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  38. Analysis of partially oxidised epitaxial silicon mono-layers on germanium virtual substrates using aberration corrected scanning transmission electron microscopy

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  39. A TEM study of Ge-on-(111)Si structures for potential use in high performance PMOS device technology

    Article • Journal of Physics Conference Series, November 2011, Institute of Physics Publishing

    Dr Thomas Walther

  40. Direct observation by transmission electron microscopy of the influence of Ni catalyst-seeds on the growth of GaN–AlGaN axial heterostructure nanowires

    Article • Journal of Crystal Growth, July 2011, Elsevier

    Dr Thomas Walther

  41. Room-Temperature GaAs/AlGaAs Quantum Cascade Lasers Grown by Metal–Organic Vapor Phase Epitaxy

    Article • IEEE Photonics Technology Letters, June 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Thomas Walther

  42. Room Temperature GaAs/AlGaAs Quantum Cascade Lasers with InGaP and InAlP Waveguides

    Article • January 2011, Optical Society of America (OSA)

    Dr Thomas Walther

  43. High temperature ∼4 [micro sign]m In0.7Ga0.3As/In0.34Al0.66As quantum cascade lasers grown by MOVPE

    Article • Electronics Letters, January 2011, the Institution of Engineering and Technology (the IET)

    Dr Thomas Walther

  44. STEM imaging of InP/AlGaInP quantum dots

    Article • Journal of Physics Conference Series, September 2010, Institute of Physics Publishing

    Dr Thomas Walther

  45. Electron microscopy of AlGaN-based multilayers for UV laser devices

    Article • Journal of Physics Conference Series, July 2010, Institute of Physics Publishing

    Dr Thomas Walther

  46. Study of the effect of annealing of In(Ga)As quantum dots

    Article • Journal of Physics Conference Series, July 2010, Institute of Physics Publishing

    Dr Thomas Walther

  47. Measuring the contrast in annular dark field STEM images as a function of camera length

    Article • Journal of Physics Conference Series, July 2010, Institute of Physics Publishing

    Dr Thomas Walther

  48. Probe position recovery for ptychographical imaging

    Article • Journal of Physics Conference Series, July 2010, Institute of Physics Publishing

    Dr Thomas Walther

  49. An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k -factors

    Article • Journal of Physics Conference Series, July 2010, Institute of Physics Publishing

    Dr Thomas Walther

  50. Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

    Article • Journal of Physics Conference Series, July 2010, Institute of Physics Publishing

    Dr Thomas Walther

  51. TEM analysis of Si-passivated Ge-on-Si MOSFET structures for high performance PMOS device technology

    Article • Journal of Physics Conference Series, July 2010, Institute of Physics Publishing

    Dr Thomas Walther

  52. Study of annealed InAs/GaAs quantum dot structures

    Article • Journal of Physics Conference Series, February 2010, Institute of Physics Publishing

    Dr Thomas Walther

  53. Quantitative investigation of the onset of islanding in strained layer epitaxy of InAs/GaAs by X-ray mapping in STEM

    Article • Journal of Physics Conference Series, February 2010, Institute of Physics Publishing

    Dr Thomas Walther

  54. Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

    Article • Journal of Physics Conference Series, February 2010, Institute of Physics Publishing

    Dr Thomas Walther

  55. GaN, AlGaN, HfO 2 based radial heterostructure nanowires

    Article • Journal of Physics Conference Series, February 2010, Institute of Physics Publishing

    Dr Thomas Walther

  56. TEM analysis of Ge-on-Si MOSFET structures with HfO 2 dielectric for high performance PMOS device technology

    Article • Journal of Physics Conference Series, February 2010, Institute of Physics Publishing

    Dr Thomas Walther

  57. 16th International Conference on Microscopy of Semiconducting Materials

    Article • Journal of Physics Conference Series, January 2010, Institute of Physics Publishing

    Dr Thomas Walther

  58. Influence of thick crystal effects on ptychographic image reconstruction with moveable illumination

    Article • Ultramicroscopy, September 2009, Elsevier

    Dr Thomas Walther

  59. A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

    Article • Journal of Physics Conference Series, August 2008, Institute of Physics Publishing

    Dr Thomas Walther

  60. A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

    Article • Journal of Physics Conference Series, August 2008, Institute of Physics Publishing

    Dr Thomas Walther

  61. 1.55 μ m InAs quantum dots grown on a GaAs substrate using a GaAsSb metamorphic buffer layer

    Article • Applied Physics Letters, March 2008, American Institute of Physics

    Chaoyuan Jin, Dr Thomas Walther

  62. Electro-Assisted Photo-Luminescence of Colloidal Germanium Nanoparticles

    Article • Zeitschrift für Physikalische Chemie, March 2007, De Gruyter

    Dr Thomas Walther

  63. Preliminary Results from the First Monochromated and Aberration Corrected 200-kV Field-Emission Scanning Transmission Electron Microscope

    Article • Microscopy and Microanalysis, October 2006, Cambridge University Press

    Dr Thomas Walther

  64. First experimental test of a new monochromated and aberration-corrected 200kV field-emission scanning transmission electron microscope

    Article • Ultramicroscopy, October 2006, Elsevier

    Dr Thomas Walther

  65. Linear least-squares fit evaluation of series of analytical spectra from planar defects: extension and possible implementations in scanning transmission electron microscopy

    Article • Journal of Microscopy, August 2006, Wiley

    Dr Thomas Walther

  66. Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide

    Article • International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde), July 2006, Carl Hanser Verlag

    Dr Thomas Walther

  67. A Novel Method of Analytical Transmission Electron Microscopy for Measuring Highly Accurately Segregation to Special Grain Boundaries or Planar Interfaces

    Article • Microchimica Acta, April 2006, Springer Science + Business Media

    Dr Thomas Walther

  68. Laser-Assisted Synthesis of Au−Ag Alloy Nanoparticles in Solution

    Article • The Journal of Physical Chemistry, February 2006, American Chemical Society (ACS)

    Dr Thomas Walther

  69. A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy

    Article • Journal of Microscopy, February 2006, Wiley

    Dr Thomas Walther

  70. Combinatorial investigation of the isolated nanoparticle to coalescent layer transition in a gradient sputtered gold nanoparticle layer on top of polystyrene

    Article • Applied Physics Letters, January 2006, American Institute of Physics

    Dr Thomas Walther

  71. High ultimate tensile stress in nano-grained superelastic NiTi thin films

    Article • Materials Science and Engineering A, January 2006, Elsevier

    Dr Thomas Walther

  72. Structural and magnetic characteristics of FeCo thin films modified by combinatorial ion implantation

    Article • Thin Solid Films, January 2006, Elsevier

    Dr Thomas Walther

  73. Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction

    Article • Ultramicroscopy, October 2005, Elsevier

    Dr Thomas Walther

  74. Photofragmentation of Phase-Transferred Gold Nanoparticles by Intense Pulsed Laser Light

    Article • The Journal of Physical Chemistry, August 2005, American Chemical Society (ACS)

    Dr Thomas Walther

  75. Influence of Intense Pulsed Laser Irradiation on Optical and Morphological Properties of Gold Nanoparticle Aggregates Produced by Surface Acid−Base Reactions

    Article • Langmuir, May 2005, American Chemical Society (ACS)

    Dr Thomas Walther

  76. Development of a new analytical electron microscopy technique to quantify the chemistry of planar defects and to measure accurately solute segregation to grain boundaries

    Article • Journal of Microscopy, August 2004, Wiley

    Dr Thomas Walther

  77. Diffusion and segregation effects in doped manganite/titanate heterostructures

    Article • Applied Physics Letters, May 2004, American Institute of Physics

    Dr Thomas Walther

  78. Twin Boundaries in Zinc Oxide with Additions of Gallium Oxide

    Article • Interface Science, April 2004, Springer Science + Business Media

    Dr Thomas Walther

  79. A New Method to Measure Small Amounts of Solute Atoms on Planar Defects and Application to Inversion Domain Boundaries in Doped Zinc Oxide

    Article • Interface Science, April 2004, Springer Science + Business Media

    Dr Thomas Walther

  80. Structural and doping effects in the half-metallic double perovskite A 2 CrWO 6 ( A = Sr, Ba, and Ca)

    Article • October 2003, American Physical Society (APS)

    Dr Thomas Walther

  81. Electron energy-loss spectroscopic profiling of thin film structures: 0.39nm line resolution and 0.04eV precision measurement of near-edge structure shifts at interfaces

    Article • Ultramicroscopy, September 2003, Elsevier

    Dr Thomas Walther

  82. Stranski-Krastanow transition and epitaxial island growth

    Article • August 2002, American Physical Society (APS)

    Dr Thomas Walther, Dr Max A Migliorato

  83. Microstructure and magnetoresistance of epitaxial films of the layered perovskite La 2 − 2 x Sr 1 + 2 x Mn 2 O 7 ( x = 0.3 and 0.4)

    Article • April 2002, American Physical Society (APS)

    Dr Thomas Walther

  84. Measurement of diffusion lengths in quaternary semiconducting thin layers by spectrum imaging

    Article • Physica B Condensed Matter, December 2001, Elsevier

    Dr Thomas Walther

  85. Structure and Chemistry of Basal-Plane Inversion Boundaries in Antimony Oxide-Doped Zinc Oxide

    Article • Journal of the American Ceramic Society, November 2001, Wiley

    Dr Thomas Walther

  86. Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contacts on Si-doped GaN

    Article • Applied Surface Science, July 2001, Elsevier

    Dr Thomas Walther

  87. Thermal Stability of ZnMgSSe/ZnSe Laser Heterostructures

    Article • phys stat sol (a), June 2001, Wiley

    Dr Thomas Walther

  88. Nature of the Stranski-Krastanow Transition during Epitaxy of InGaAs on GaAs

    Article • Physical Review Letters, March 2001, American Physical Society (APS)

    Dr Thomas Walther

  89. Epitaxial Island Growth and the Stranski-Krastanow Transition

    Article • MRS Proceedings, January 2001, Cambridge University Press

    Dr Thomas Walther, Dr Max A Migliorato

  90. Diffusion Processes in Strained Silicon Germanium Island Structures

    Article • Defect and Diffusion Forum, August 2000, Trans Tech Publications

    Dr Thomas Walther

  91. A Study of Sulphur Diffusion in ZnMgSSe/ZnSe Quantum Wells by Energy-Loss Imaging in a Transmission Electron Microscope

    Article • phys stat sol (a), July 2000, Wiley

    Dr Thomas Walther

  92. Coexistence of clusters, GPB zones, S″-, S′- and S-phases in an Al–0.9% Cu–1.4% Mg alloy

    Article • Acta Materialia, June 2000, Elsevier

    Dr Thomas Walther

  93. The nature of islanding in the InGaAs / GaAs epitaxial system

    Article • MRS Proceedings, January 2000, Cambridge University Press

    Dr Thomas Walther

  94. A quantitative study of compositional profiles of chemical vapour-deposited strained silicon–germanium/silicon layers by transmission electron microscopy

    Article • Journal of Crystal Growth, February 1999, Elsevier

    Dr Thomas Walther

  95. Development of a technique for a quantitative study of the order and composition of an iron-palladium alloy on the nanometre scale in an electron microscope with imaging filter

    Article • Philosophical Magazine Letters, January 1999, Taylor & Francis

    Dr Thomas Walther

  96. Transmission electron microscopy study of Si δ-doped GaAs/AlGaAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structures

    Article • Thin Solid Films, October 1997, Elsevier

    Dr Thomas Walther

  97. Observation of vertical and lateral Ge segregation in thin undulating SiGe layers on Si by electron energy-loss spectroscopy

    Article • Applied Physics Letters, August 1997, American Institute of Physics

    Dr Thomas Walther

  98. Diffusion and Surface Segregation in Thin SiGe/Si Layers Studied by Scanning Transmission Electron Microscopy

    Article • Defect and Diffusion Forum, January 1997, Trans Tech Publications

    Dr Thomas Walther

  99. Maxwell's Demon and Data Analysis [and Discussion]

    Article • Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences, November 1996, Royal Society Publishing

    Dr Thomas Walther

  100. A Correlation between Compositional Fluctuations and Surface Undulations in Strained Layer Epitaxy

    Article • Materials Science Forum, November 1995, Trans Tech Publications

    Dr Thomas Walther

  101. Detection of random alloy fluctuations in high-resolution transmission electron micrographs of AlGaAs

    Article • Philosophical Magazine A, October 1995, Taylor & Francis

    Dr Thomas Walther

  102. Quantitative characterization of AlAs/GaAs interfaces by high-resolution transmission electron microscopy along the ?100? and the ?110? projection

    Article • November 1993, Springer Science + Business Media

    Dr Thomas Walther

  103. Comparing InGaAs and GaAsSb Metamorphic Buffer Layers on GaAs Substrates for InAs Quantum Dots Emitting at 1.55μm

    Article • Springer Science + Business Media

    Chaoyuan Jin, Dr Thomas Walther

  104. Investigating the Capping of InAs Quantum Dots by InGaAs

    Article • Springer Science + Business Media

    Dr Thomas Walther

  105. The Mechanism of the Stranski-Krastanov Transition

    Article • Springer Science + Business Media

    Dr Thomas Walther, Dr Max A Migliorato

  106. Quantifying the Top-Bottom Effect in Energy-Dispersive X-Ray Spectroscopy of Nanostructures Embedded in Thin Films

    Article • Springer Science + Business Media

    Dr Thomas Walther

  107. Measuring coherence in an electron beam for imaging

    Article • Springer Science + Business Media

    Dr Thomas Walther

  108. Comparison of monochromated electron energy-loss with X-ray absorption near-edge spectra: ELNES vs. XANES

    Article • Springer Science + Business Media

    Dr Thomas Walther

  109. Investigating the influence of dynamic scattering on ptychographical iterative techniques

    Article • Springer Science + Business Media

    Dr Thomas Walther

  110. Simple method to improve quantification accuracy of energy-dispersive X-ray spectroscopy in an analytical transmission electron microscope by specimen tilting

    Article • Springer Science + Business Media

    Dr Thomas Walther

  111. Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures

    Article • Springer Science + Business Media

    Dr Thomas Walther

  112. ConceptEM: a new method to quantify solute segregation to interfaces or planar defect structures by analytical TEM and applications to inversion domain boundaries in doped zinc oxide

    Article • Springer Science + Business Media

    Dr Thomas Walther

  113. Thermal stability of ZnMgSSe/ZnSe laser heterostructures

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Dr Thomas Walther